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assignment six
Ryan Turner, Nick A, Thomas B
Programa I: Medidas de tendencia central
Este es el primer programa, donde se calculan la media, mediana y moda de un conjunto de calificaciones.
Plot
column bar plot
Homework2
GRAFICOS DE CONTROL
QCC
Homework 1
STATISTICAL DATA R
DATO ESTADISTICO CON R
Baseball Data Exploration Project Summary
Baseball Data Exploration Project Summary
Publish Document
Assignment 2
A simple spatial analysis of restaurants in Duluth, Ga
Cultivation
DocumStatistical Process Control of Semiconductor Resistivity Using X-bar and R Chartsent
This analysis applies Statistical Process Control (SPC) techniques to monitor semiconductor resistivity measurements. Retrospective Phase I analysis identified and excluded two special-cause subgroups (6 and 16) to establish stable control limits. Using these limits, Phase II online monitoring showed all subgroups in control with no evidence of mean or dispersion shifts. The study highlights the importance of identifying assignable causes, maintaining stable processes, and continuing routine SPC for process reliability.