Semiconductor manufacturing relies heavily on precise control of thin film deposition processes. In this project, we investigate the relationship between film thickness and electrical resistance in semiconductor wafers. The goal is to determine whether film thickness is a strong predictor of resistance, which has implications for process control and quality improvement in semiconductor fabrication.

Nama : Zahra Mahendra Putri NIM : 3338230009 Mata Kuliah : Eksplorasi dan Visualisasi Data Prodi : Statistika Untirta