Recently Published
Lateral Root cross-section analysis
Quick analysis of lateral root cross-section quantifications performed by Emily Miller in Julkowska lab
Assignment - Data Scientist
By Stella Wang
TUGAS 1 VISUALISASI KATEGORIK EKSPLORASI DAN VISUALISASI DATA
Nama : Zahra Mahendra Putri
NIM : 3338230009
Mata Kuliah : Eksplorasi dan Visualisasi Data
Prodi : Statistika Untirta
Modeling Electrical Resistance in Semiconductor Wafer Testing
Semiconductor manufacturing relies heavily on precise control of thin film deposition processes. In this project, we investigate the relationship between film thickness and electrical resistance in semiconductor wafers. The goal is to determine whether film thickness is a strong predictor of resistance, which has implications for process control and quality improvement in semiconductor fabrication.
TUGAS 2 EKSPLORASI DAN VISUALISASI DATA
Nama : Zahra Mahendra Putri
NIM : 3338230009
Mata Kuliah : Eksplorasi dan Visualisasi Data
Prodi : Statistika Untirta
