This report provides a detailed, step-by-step guide to analyzing factors that influence law students’ success on the bar exam using logistic regression. The analysis was conducted for a major university’s law school in Texas to help administrators understand which academic and preparatory factors most significantly impact bar passage rates.

Semiconductor manufacturing relies heavily on precise control of thin film deposition processes. In this project, we investigate the relationship between film thickness and electrical resistance in semiconductor wafers. The goal is to determine whether film thickness is a strong predictor of resistance, which has implications for process control and quality improvement in semiconductor fabrication.